E13000 - SEMI E130 - Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300) Revision:SEMI E130-0618 (Reapproved 0723) - Current 2-0698 (first published)

2-0698 (first published)

This Test Method defines an evaluation method for EFFU which is installed inside an enclosed space to remove particles that are generated inside process equipment

or mounting attitudes

SEMI MF671 — Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials

this Standard can be applied to RF power deliver systems used in similar processing equipment for other high-tech industries (e

E13000 - SEMI E130 - Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300) Revision:SEMI E130-0618 (Reapproved 0723) - Current 2-0698 (first published)This Standard establishes a Prober Specific Equipment Model for prober equipment deployed in a factory adhering to the Global Joint Guidance for 300 mm Standards (PSEM300). The PSEM300 consists of equipment characteristics and behaviors that apply to this class of equipment and are required to be implemented. The intent of this Standard is to facilitate the integration of prober equipment into an automated semiconductor factory. This Standard