G09100 - SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog Revision:SEMI G91-0513 - Inactive Aspects of the 200 mm

Aspects of the 200 mm (8 in

SEMI M6-1000 (technical revision)

本テスト方法は，半導体プロセスに使用されるすべてのタイプの表面実装および一般的ガス配分システムに適用することができる。

- Disk Compression can be applied to all three types of encapsulation materials

·    Computers and communication systems

G09100 - SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog Revision:SEMI G91-0513 - Inactive Aspects of the 200 mmNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. The purpose of this Standard is to provide a common format for memory fail datalog specification along with necessary synchronization information enabling an efficient dataflow for volume diagnostics applications for