PV04000 - SEMI PV40 - Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments StdTpc-Silicon NTPv4 protocol for time synchronization

NTPv4 protocol for time synchronization is specified in this Standard because it is applicable to systems communicating by local area networks supporting multicast messaging including but not limited to Ethernet

3  Background

5  To comply with this Specification

SEMI M15 — Polished Wafer Defect Limits Table for Polished Gallium Arsenide Wafers

Similar to the World Fab Watch

PV04000 - SEMI PV40 - Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments StdTpc-Silicon NTPv4 protocol for time synchronizationSilicon (Si) wafers for PV applications cut from a Si ingot or Si brick contain a variety of micro and macroscopic crystallographic defects and flaws that may impact the efficiency of a solar cells or the yield of a manufacturing line. Theses defects can be categorized by their origin, either as grown in defects that are generated during the solidification of the Si ingot or as process induced defects that are generated by abrasive processes during