D07700 - SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method SEMIViews SEMI E169-0414 (first published)

SEMI E169-0414 (first published)

failure rate) as specified in the applicable SEMI E49 Subordinate Standards

12-94 (technical revision)

本スタンダードは，Gases Global Technical Committeeで技術的に承認されている。現版は2011年9月12日，global Audits and Reviews Subcommitteeにて発行が承認された。2011年11月にwww

NOTICE: This Document was balloted and approved for withdrawal in 2004

D07700 - SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method SEMIViews SEMI E169-0414 (first published)This Standard establishes the method that evaluates with high precision a shape of the polarizing films and other films for FPD, especially non rectangle shape films. This Standard specifies the measurement method of polarizing films and other films for FPD by using contour matching method. This Standard can apply to rectangle shapes. Especially non rectangle shapes are effective. Examples of the other films except polarizing films are retardation